Advanced Microwave Impedance Microscopy for Emerging Materials and Devices

Microwave impedance microscopy (MIM) is a powerful scanning probe technique that allows non-contact characterization of local complex permittivity or electric potential at GHz frequencies with minimal sample preparation. Here we present a series of recent advancements in MIM, including drift-free Johnson-noise-limited operation, sub-zF sensitivity, continuous-frequency spectroscopy, and photoconductivity nano-interferometry. These innovations significantly broaden the scope of MIM, providing new capabilities for the characterization of electronic and optoelectronic materials and devices.